Transmission Electron Microscopes (STEM/TEM)
- Nion UltraSTEM The Nion UltraSTEM is a state-of-the-art scanning transmission electron microscope (STEM) capable of imaging and spectroscopy with atomic resolution.
- FEI Titan 80 – 300kV FEG S/TEM The FEI Titan 80 – 300kV FEG S/TEM (Scanning / Transmission Electron Microscope) is a powerful instrument capable of high resolution S/TEM imaging and nanoscale analytical materials characterisation.
- JEOL 2100 LaB TEM The JEOL 2100 LaB TEM is capable of high resolution imaging and is suitable for a wide range of materials, from nanomaterials to biological specimens.