Scanning Electron Microscopes
- Zeiss ULTRA plus This is a high resolution and analytical field emission Scanning Electron Microscope. Equipped with both InLens and SE2 detectors, users can obtain high resolution and topographical details of their samples, respectively. It also has an energy selective backscatter detector (EsB) for low kV compositional details of the samples.
- Zeiss ULTRA plus Cryo SEM Cryo SEM offers the opportunity to capture high resolution images of frozen, fully hydrated samples in a condition very close to their native state.