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CRANN - Advanced Microscopy Laboratory
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CRANN - Advanced Microscopy Laboratory
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Gaeilge
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Sample Preparation
Sample Preparation
Fishione 1040 NanoMill
The Fishione 1040 NanoMill is an instrument designed specifically to prepare samples for investigation with TEM.
Learn More
Instrumentation
Transmission Electron Microscopes (STEM/TEM)
The Nion UltraSTEM
JEOL 2100 LaB TEM
FEI Titan 80 – 300kV FEG S/TEM
Scanning Electron Microscopes
Zeiss ULTRA plus Cryo SEM
Zeiss ULTRA plus
Electron Beam Lithography
Zeiss SUPRA 40
Elionix ELS 7700
Focused Ion Beam (FIB) Technologies
Zeiss AURIGA Focused Ion Beam
Zeiss ORION Nanofab
FEI Strata 235DB
Sample Preparation
Fishione 1040 NanoMill
