Focused Ion Beam (FIB) Technologies
- Zeiss ORION Nanofab Installed in November 2015, the ORION Nanofab is the only instrument of its kind in Ireland.
- Zeiss AURIGA Focused Ion Beam The Carl Zeiss Auriga Focused Ion Beam (FIB) system is a versatile microscope tool for failure analysis, construction analysis, investigating embedded particles and features, implanting and deposition of selected materials and for in-situ TEM sample prep.
- FEI Strata 235DB The FEI Strata 235DB is a dual beam FIB/ SEM system equipped with multiple electron detectors, and also includes a secondary ion detector.